As CMOS semiconductor technology strides towards billions of transistors on a single die new problems arise on the way. They are concerned with the - minishing fabrication process features, which a?ect for example the gate-to-wire delay ratio. They manifest themselves in greater variations of size and operating parameters of devices, which put the overall reliability of systems at risk. And, most of all, they have tremendous impact on design productivity, where the costs of utilizing the growing silicon real estate rocket to billions of dollars that have to be spent on design, veri?cation,...

This book is the result of a long friendship, of a broad international co operation, and of a bold dream. It is the summary of work carried out by the authors, and several other wonderful people, during more than 15 years, across 3 continents, in the course of countless meetings, workshops and discus sions. It shows that neither language nor distance can be an obstacle to close scientific cooperation, when there is unity of goals and true collaboration. When we started, we had very different approaches to handling the mys terious, almost magical world of asynchronous circuits. Some were more...