Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application of finite element methods (FEMs) to the study of ULSI interconnect reliability. Over the past two decades the application of FEMs has become widespread and continues to lead to a much better understanding of reliability physics.
To help readers cope with the increasing sophistication of FEMs' applications to interconnect reliability, Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections will:...
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application o...
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application of finite element methods (FEMs) to the study of ULSI interconnect reliability. Over the past two decades the application of FEMs has become widespread and continues to lead to a much better understanding of reliability physics.
To help readers cope with the increasing sophistication of FEMs' applications to interconnect reliability, Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections will:...
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application o...
Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels. Electromigration (EM) of interconnects has now become the dominant failure mechanism that determines the circuit reliability. This brief addresses the readers to the necessity of 3D real circuit modelling in order to evaluate the EM of interconnect system in ICs, and how they can create such models for their own applications. A 3-dimensional...
Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the ...
