The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists.
"This book will be an aid to survey statisticians and to research workers who must work with survey data." -Short Book Reviews, International Statistical Institute
Measurement Errors in...
WILEY-INTERSCIENCE PAPERBACK SERIES
The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consum...
Combining theoretical, methodological, and practical aspects, Latent Class Analysis of Survey Error successfully guides readers through the accurate interpretation of survey results for quality evaluation and improvement. This book is a comprehensive resource on the key statistical tools and techniques employed during the modeling and estimation of classification errors, featuring a special focus on both latent class analysis (LCA) techniques and models for categorical data from complex sample surveys.
Drawing from his extensive experience in the field of survey methodology, the author...
Combining theoretical, methodological, and practical aspects, Latent Class Analysis of Survey Error successfully guides readers through the accurate i...
An edited volume for an upcoming conference on Total Survey Error (TSE), this book provides an overview of the TSE framework and current TSE research as related to survey design, data collection, estimation and analysis. The book recognizes that survey data affects many public policy and business decisions, and thus focuses on the framework for understanding and improving survey data quality.
The book also addresses issues with data quality in official statistics and in survey, opinion, and market research as the field of statistics has changed, leading to larger and messier...
An edited volume for an upcoming conference on Total Survey Error (TSE), this book provides an overview of the TSE framework and current TSE resear...