Hans-Joachim Lenz Wolfgang Schmid Peter-Theodor Wilrich
The 10th International Workshop on Intelligent Statistical Quality Control took place in Seattle, USA, Aug 18-20, 2010. It was hosted by Professor C. M. Mastrangelo, Department of Industrial and Systems Engineering, University of Washington, Seattle. The workshop was jointly organized by Professors H. J. Lenz, C. M. Mastrangelo, W. Schmid and P.T. Wilrich. The twenty-seven papers in this volume were carefully selected by the scientific program committee, reviewed by its members, revised by the authors and, finally, adapted for this volume by the editors.
The book is divided into two...
The 10th International Workshop on Intelligent Statistical Quality Control took place in Seattle, USA, Aug 18-20, 2010. It was hosted by Professor ...
This edited volume is divided into two parts: Part I On-line Control covers fields like control charting, monitoring and surveillance as well as acceptance sampling. Part II Off-line Control is devoted to experimental design, process-capability analysis and data quality. It is based on the 11th International Workshop on Intelligent Statistical Quality Control, which took place in Sydney, Australia, August 20 - 23, 2013 and presents papers that were carefully selected by the scientific program committee, reviewed by its members, revised by the authors and, finally, adapted for this volume by...
This edited volume is divided into two parts: Part I On-line Control covers fields like control charting, monitoring and surveillance as well as accep...
The main focus of this edited volume is on three major areas of statistical quality control: statistical process control (SPC), acceptance sampling and design of experiments.
The main focus of this edited volume is on three major areas of statistical quality control: statistical process control (SPC), acceptance sampling an...
