Valeri P. Tolstoy Irina Chernyshova Valeri A. Skryshevsky
The rapid increase in commercially available Fourier transform infrared spectrometers and computers since 1990 has made it feasible to use IR spectrometry to characterize very thin films at extended interfaces
The rapid increase in commercially available Fourier transform infrared spectrometers and computers since 1990 has made it feasible to use IR spectrom...
