The layout of an integrated circuit (lC) is the process of assigning geometric shape, size and position to the components (transistors and connections) used in its fabrication. Since the number of components in modem ICs is enormous, computer aided-design (CAD) programs are required to automate the difficult layout process. Prior CAD methods are inexact or limited in scope, and produce layouts whose area, and consequently manufacturing costs, are larger than necessary. This book addresses the problem of minimizing exactly the layout area of an important class of basic IC structures called...
The layout of an integrated circuit (lC) is the process of assigning geometric shape, size and position to the components (transistors and connections...
Although bats are often thought of as cave dwellers, many species depend on forests for all or part of the year. Of the 45 species of bats in North America, more than half depend on forests, using the bark of trees, tree cavities, or canopy foliage as roosting sites. Over the past two decades it has become increasingly clear that bat conservation and management are strongly linked to the health of forests within their range.
Initially driven by concern for endangered species--the Indiana bat, for example--forest ecologists, timber managers, government agencies, and conservation...
Although bats are often thought of as cave dwellers, many species depend on forests for all or part of the year. Of the 45 species of bats in North...
Test generation is one of the most difficult tasks facing the designer of complex VLSI-based digital systems. Much of this difficulty is attributable to the almost universal use in testing of low, gate-level circuit and fault models that predate integrated circuit technology. It is long been recognized that the testing prob lem can be alleviated by the use of higher-level methods in which multigate modules or cells are the primitive components in test generation; however, the development of such methods has proceeded very slowly. To be acceptable, high-level approaches should be applicable to...
Test generation is one of the most difficult tasks facing the designer of complex VLSI-based digital systems. Much of this difficulty is attributable ...
Test generation is one of the most difficult tasks facing the designer of complex VLSI-based digital systems. Much of this difficulty is attributable to the almost universal use in testing of low, gate-level circuit and fault models that predate integrated circuit technology. It is long been recognized that the testing prob lem can be alleviated by the use of higher-level methods in which multigate modules or cells are the primitive components in test generation; however, the development of such methods has proceeded very slowly. To be acceptable, high-level approaches should be applicable to...
Test generation is one of the most difficult tasks facing the designer of complex VLSI-based digital systems. Much of this difficulty is attributable ...