Improve design efficiency and reduce costs with this practical guide to formal and simulation-based functional verification. Giving you a theoretical and practical understanding of the key issues involved, expert authors including Wayne Wolf and Dan Gajski explain both formal techniques (model checking, equivalence checking) and simulation-based techniques (coverage metrics, test generation). You get insights into practical issues including hardware verification languages (HVLs) and system-level debugging. The foundations of formal and simulation-based techniques are covered too, as are more...
Improve design efficiency and reduce costs with this practical guide to formal and simulation-based functional verification. Giving you a theoretical ...
Michael Nicolaidis Yervant Zorian Dhiraj K. Pradhan
Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of...
Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended func...
This book provides a guide to Static Random Access Memory (SRAM) bitcell design and analysis to meet the nano-regime challenges for CMOS devices and emerging devices, such as Tunnel FETs. Since process variability is an ongoing challenge in large memory arrays, this book highlights the most popular SRAM bitcell topologies (benchmark circuits) that mitigate variability, along with exhaustive analysis. Experimental simulation setups are also included, which cover nano-regime challenges such as process variation, leakage and NBTI for SRAM design and analysis. Emphasis is placed throughout the...
This book provides a guide to Static Random Access Memory (SRAM) bitcell design and analysis to meet the nano-regime challenges for CMOS devices an...
This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented.
This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic sy...
