* Examines the various methods available for circuit protection, including coverage of the newly developed ESD circuit protection schemes for VLSI circuits. * Provides guidance on the implementation of circuit protection measures. * Includes new sections on ESD design rules, layout approaches, package effects, and circuit concepts. * Reviews the new Charged Device Model (CDM) test method and evaluates design requirements necessary for circuit protection.
* Examines the various methods available for circuit protection, including coverage of the newly developed ESD circuit protection schemes for VLSI cir...
In this second edition, the authors identify the sources of failure mechanism in semiconductor devices, examine possible detection and elimination techniques, and determine the effectiveness of reliability devices. The references have been updated and all recent advances in the field have been incorporated into the text.
In this second edition, the authors identify the sources of failure mechanism in semiconductor devices, examine possible detection and elimination tec...
