Defect and Microstructure Analysis by Diffraction looks at a key aspect of state-of-the-art methods for analyzing the actual structure of materials. Diffraction analysis is typically based on idealized crystals. The impurities and irregularities that work themselves into virtually all crystal structures, however, cause diffraction peak profiles to broaden and sometimes become asymmetric, making the data difficult to interpret. More powerful methods are undoing this effect, using the discrepancies themselves to describe microstructure of the material with unprecedented accuracy. These...

This book represents the proceedings of the second inter disciplinary conference on materials characterization held from July 30 through August 3, 1984 at the New York State College of Ceramics at Alfred University. The conference was the 20th in the University Series on Ceramic Science, instituted in 1964 by Alfred University, the University of California at Berkeley, North Carolina State University and Notre Dame University. Volume I of the proceedings of the first conference using this interdisciplinary approach to materials characterization was published as "Advances in Materials...