are intended to fill the gap between a manufacturer's handbook, and review articles that highlight the latest scientific developments. A fourth volume will deal with techniques for specimen handling, beam artifacts, and depth profiling. It will provide a compilation of methods that have proven useful for specimen handling and treatment, and it will also address the common artifacts and problems associated with the bombardment of solid sur faces by photons, electrons, and ions. A description will be given of methods for depth profiling. Surface characterization measurements are being used...

Emphasizes the behaviour of material from the molecular point of view. This work is for engineering students who have a background in chemistry and physics and in thermodynamics. It assumes a background in calculus and differential equations. Here, each chapter includes an array of exercises, for which a Student Solutions Manual is also available.