Miron Abramovici Arthur D. Friedman Melvin A. Breuer
This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in...
This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art covera...
Since the early 1960's there has developed a great interest, both in industry and academia, in the subjects of maintenance and reliability of digital systems. The increased complexity of current systems makes this interest well justified. Costs associated with the necessity to maintain such systems represent a substantial and growing percentage of total system costs. In this book we consider many of the problems associated with diagnosing failures in digital systems, locating the source of such failures, and the related problem of design of ultra reliable systems - systems which do not fail...
Since the early 1960's there has developed a great interest, both in industry and academia, in the subjects of maintenance and reliability of digital ...