This book presents the basics and characterization of defects at oxide surfaces. It provides a state-of-the-art review of the field, containing information to the various types of surface defects, describes analytical methods to study defects, their chemical activity and the catalytic reactivity of oxides.
This book presents the basics and characterization of defects at oxide surfaces. It provides a state-of-the-art review of the field, containing inform...
Experimental advances in helium atom scattering spectroscopy over the last forty years have allowed the measurement of surface phonon dispersion curves of more than 200 different crystal surfaces and overlayers of insulators, semiconductors and metals.
Experimental advances in helium atom scattering spectroscopy over the last forty years have allowed the measurement of surface phonon dispersion curve...
This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics.
This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Relevant fundamentals are briefly reviewed be...
This second edition provides a cutting-edge overview of physical, technical and scientific aspects related to the widely used analytical method of confocal Raman microscopy.
This second edition provides a cutting-edge overview of physical, technical and scientific aspects related to the widely used analytical method of con...
This book provides a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces.
This book provides a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron application...
