Wyniki wyszukiwania:
wyszukanych pozycji: 8
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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability
ISBN: 9781441945136 / Angielski / Miękka / 2010 / 408 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new... Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such ... |
cena:
605,23 zł |
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Integrated Circuit Authentication: Hardware Trojans and Counterfeit Detection
ISBN: 9783319008158 / Angielski / Twarda / 2013 / 222 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) This book describes techniques to verify the authenticity of integrated circuits (ICs). It focuses on hardware Trojan detection and prevention and counterfeit detection and prevention.The authors discuss a variety of detection schemes and design methodologies for improving Trojan detection techniques, as well as various attempts at developing hardware Trojans in IP cores and ICs. While describing existing Trojan detection methods, the authors also analyze their effectiveness in disclosing various types of Trojans, and demonstrate several architecture-level solutions.
This book describes techniques to verify the authenticity of integrated circuits (ICs). It focuses on hardware Trojan detection and prevention and cou...
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cena:
484,18 zł |
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Integrated Circuit Authentication: Hardware Trojans and Counterfeit Detection
ISBN: 9783319374987 / Angielski / Miękka / 2016 / 222 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) This book describes techniques to verify the authenticity of integrated circuits (ICs). It focuses on hardware Trojan detection and prevention and counterfeit detection and prevention. The authors discuss a variety of detection schemes and design methodologies for improving Trojan detection techniques, as well as various attempts at developing hardware Trojans in IP cores and ICs. While describing existing Trojan detection methods, the authors also analyze their effectiveness in disclosing various types of Trojans, and demonstrate several architecture-level solutions.
This book describes techniques to verify the authenticity of integrated circuits (ICs). It focuses on hardware Trojan detection and prevention and cou...
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cena:
414,77 zł |
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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability
ISBN: 9780387747460 / Angielski / Twarda / 2007 / 408 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new... Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such ... |
cena:
605,23 zł |
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Introduction to Hardware Security and Trust
ISBN: 9781441980793 / Angielski / Twarda / 2011 / 427 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) This book provides the foundations for understanding hardware security and trust, which have become major concerns for national security over the past decade. Coverage includes security and trust issues in all types of electronic devices and systems such as ASICs, COTS, FPGAs, microprocessors/DSPs, and embedded systems. This serves as an invaluable reference to the state-of-the-art research that is of critical significance to the security of, and trust in, modern society's microelectronic-supported infrastructures.
This book provides the foundations for understanding hardware security and trust, which have become major concerns for national security over the past...
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cena:
645,58 zł |
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Introduction to Hardware Security and Trust
ISBN: 9781489990365 / Angielski / Miękka / 2014 / 427 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) This book provides the foundations for understanding hardware security and trust, which have become major concerns for national security over the past decade. Coverage includes security and trust issues in all types of electronic devices and systems such as ASICs, COTS, FPGAs, microprocessors/DSPs, and embedded systems. This serves as an invaluable reference to the state-of-the-art research that is of critical significance to the security of, and trust in, modern society's microelectronic-supported infrastructures.
This book provides the foundations for understanding hardware security and trust, which have become major concerns for national security over the past...
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cena:
464,01 zł |
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Test and Diagnosis for Small-Delay Defects
ISBN: 9781441982964 / Angielski / Twarda / 2011 / 212 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect i...
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cena:
403,47 zł |
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Test and Diagnosis for Small-Delay Defects
ISBN: 9781489989529 / Angielski / Miękka / 2014 / 212 str. Termin realizacji zamówienia: ok. 22 dni roboczych (Bez gwarancji dostawy przed świętami) This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect i...
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cena:
452,50 zł |
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