wyszukanych pozycji: 2
Drifting: An Unforeseen Destination or Evolving Toward Anarchy
ISBN: 9781716444968 / Angielski / Miękka / 2020 / 252 str. Termin realizacji zamówienia: ok. 13-18 dni roboczych. |
|
cena:
87,54 zł |
Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization
ISBN: 9781606507278 / Angielski / Miękka / 2015 / 178 str. Termin realizacji zamówienia: ok. 13-18 dni roboczych. Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the... Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films rangin... |
|
cena:
347,54 zł |