Wyniki wyszukiwania:
wyszukanych pozycji: 162
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cena:
76,21 zł |
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Wreath and Other Stories: Tales of Horror and Suspense
ISBN: 9788175110878 / Angielski / Miękka / 2016 / 228 str. Termin realizacji zamówienia: ok. 13-18 dni roboczych. What is it that we fear? An evil presence around us, watching and waiting for a small slip, or the realisation that the malevolence is within us and has already made its move?
Wreath and Other Stories will take you into a world that is slightly off its hinges- a bizarre, eerie realm. In short, a world much like our own, if only we would notice it. A dangerous obsession of an artist, a broken childhood promise, a birthday gift gone horribly wrong, a soldier trapped in a nightmare, a warning from beyond the grave, a writer's new lease of life in a "suicide central," a patient's... What is it that we fear? An evil presence around us, watching and waiting for a small slip, or the realisation that the malevolence is within us and h...
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cena:
49,07 zł |
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Bibhakta Manisha O Footpathra Galpa
ISBN: 9781645601180 / Oriya / Miękka / 2020 / 232 str. Termin realizacji zamówienia: ok. 13-18 dni roboczych. |
cena:
76,21 zł |
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Friends from California
ISBN: 9781637457917 / Angielski / Miękka / 2020 / 30 str. Termin realizacji zamówienia: ok. 13-18 dni roboczych. |
cena:
42,81 zł |
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Set to Stock Market
ISBN: 9798888056844 / Angielski / Miękka / 2022 / 122 str. Termin realizacji zamówienia: ok. 13-18 dni roboczych. |
cena:
64,24 zł |
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Advances in Energy Technology: Proceedings of Icaet 2020
ISBN: 9789811587023 / Angielski / Miękka / 2021 / 294 str. Termin realizacji zamówienia: ok. 20 dni roboczych. |
cena:
783,57 zł |
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Registration and Segmentation Methodology for Perfusion MR Images
ISBN: 9783846526583 / Angielski / Miękka / 2012 / 136 str. Termin realizacji zamówienia: ok. 10-14 dni roboczych. Magnetic resonance imaging (MRI) has emerged as a reliable tool for functional analysis of internal organs like the kidney and the heart. Due to the considerable length of time taken to acquire MR images, they are affected by patient motion. Besides, MR images are characterized by low spatial resolution, noise and rapidly changing intensity. Rapid intensity change is the primary challenge that MR image registration methods need to address. This book details some approaches to overcome this challenge. We make use of saliency information that aims to imitate the working of the human visual...
Magnetic resonance imaging (MRI) has emerged as a reliable tool for functional analysis of internal organs like the kidney and the heart. Due to the c...
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cena:
271,96 zł |
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cena:
157,12 zł |
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Pankshi Akela ( पंक्षी अकेला )
ISBN: 9789390500840 / Hindi / Miękka / 2021 / 118 str. Termin realizacji zamówienia: ok. 13-18 dni roboczych. |
cena:
66,63 zł |
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Analog and Digital Communication: Visualize and analyze the communication (English Edition)
ISBN: 9789355519214 / Angielski Termin realizacji zamówienia: ok. 13-18 dni roboczych. |
cena:
166,46 zł |
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Death Of The Moon
ISBN: 9789356522466 / Angielski Termin realizacji zamówienia: ok. 13-18 dni roboczych. |
cena:
161,89 zł |
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Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling
ISBN: 9788132234241 / Angielski / Miękka / 2016 / 269 str. Termin realizacji zamówienia: ok. 20 dni roboczych. |
cena:
391,77 zł |
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Lonely Planet Vietnam, Cambodia, Laos & Northern Thailand
ISBN: 9781787017955 / Angielski / Miękka / 2021 / 576 str. Termin realizacji zamówienia: ok. 8-10 dni roboczych. |
cena:
88,12 zł |
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Recent Advances in Pmos Negative Bias Temperature Instability: Characterization and Modeling of Device Architecture, Material and Process Impact
ISBN: 9789811661198 / Angielski / Twarda / 2021 / 336 str. Termin realizacji zamówienia: ok. 20 dni roboczych. This book covers advances in Negative Bias Temperature Instability (NBTI) and will prove useful to researchers and professionals in the semiconductor devices areas. NBTI continues to remain as an important reliability issue for CMOS transistors and circuits. Development of NBTI resilient technology relies on utilizing suitable stress conditions, artifact free measurements and accurate physics-based models for the reliable determination of degradation at end-of-life, as well as understanding the process, material and device architectural impacts. This book discusses: ... This book covers advances in Negative Bias Temperature Instability (NBTI) and will prove useful to researchers and professionals in the semiconduct... |
cena:
587,67 zł |
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Get Set Go Happy: Discovering Happiness out of anything in Life
ISBN: 9781684666393 / Angielski / Miękka / 2019 / 160 str. Termin realizacji zamówienia: ok. 13-18 dni roboczych. |
cena:
74,96 zł |
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Recent Advances in PMOS Negative Bias Temperature Instability: Characterization and Modeling of Device Architecture, Material and Process Impact
ISBN: 9789811661228 / Angielski / Miękka / 2022 / 311 str. Termin realizacji zamówienia: ok. 20 dni roboczych. This book covers advances in Negative Bias Temperature Instability (NBTI) and will prove useful to researchers and professionals in the semiconductor devices areas. NBTI continues to remain as an important reliability issue for CMOS transistors and circuits. Development of NBTI resilient technology relies on utilizing suitable stress conditions, artifact free measurements and accurate physics-based models for the reliable determination of degradation at end-of-life, as well as understanding the process, material and device architectural impacts. This book discusses:Ultra-fast ...
This book covers advances in Negative Bias Temperature Instability (NBTI) and will prove useful to researchers and professionals in the semiconductor ...
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cena:
587,67 zł |
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Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling
ISBN: 9788132225072 / Angielski / Twarda / 2015 / 269 str. Termin realizacji zamówienia: ok. 20 dni roboczych. This book aims to cover different aspects of Bias Temperature Instability (BTI). BTI remains as an important reliability concern for CMOS transistors and circuits. Development of BTI resilient technology relies on utilizing artefact-free stress and measurement methods and suitable physics-based models for accurate determination of degradation at end-of-life and understanding the gate insulator process impact on BTI. This book discusses different ultra-fast characterization techniques for recovery artefact free BTI measurements. It also covers different direct measurements techniques to... This book aims to cover different aspects of Bias Temperature Instability (BTI). BTI remains as an important reliability concern for CMOS transisto... |
cena:
391,77 zł |
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That One Girl
ISBN: 9798887337500 / Angielski / Miękka / 2022 / 54 str. Termin realizacji zamówienia: ok. 13-18 dni roboczych. |
cena:
48,17 zł |
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Cardiac Imaging Update 2017
ISBN: 9789386322937 / Angielski / Twarda / 2020 / 254 str. Termin realizacji zamówienia: ok. 30 dni roboczych. Comprehensive guide to latest developments in diagnostic and prognostic cardiac imaging covering non-invasive and invasive techniques. Second part of the book covers emerging therapies in clinical cardiology and management of coronary artery disease.
Comprehensive guide to latest developments in diagnostic and prognostic cardiac imaging covering non-invasive and invasive techniques. Second part of ...
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cena:
419,75 zł |
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Textile Printing
ISBN: 9781032630083 / Twarda / 2024 / 204 str. Termin realizacji zamówienia: ok. 16-18 dni roboczych. |
cena:
445,94 zł |
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