X-Ray Scattering

ISBN-13: 9781613243268 / Angielski / Twarda / 2012 / 247 str.

Christopher M Bauwens

Opis

X-ray scattering techniques are a family of non-destructive analytical techniques which reveal information about the crystallographic structure, chemical composition and physical properties of materials and thin films. This book presents research in the study of X-ray scattering.