Construction of Optimal Reliability Test Plans

ISBN-13: 9786139908134 / Angielski / Miękka / 2018 / 104 str.

Gopichand Agnihotram

Opis

In this book, we are addressing different component reliability test plans for different systems. We adapted unique approach to compute the optimum reliability test time for each of component in the system. We can use these approaches for any industrial systems such as financial systems, health care systems etc. This will have applications in the area of Machine learning and artificial intelligence.

O autorze

Agnihotram, Gopichand
Gopichand Agnihotram is a Principal Consultant in Wipro CTO office, Wipro Limited Bangalore. Prior to join Wipro, he was Senior Research Scientist at Infosys Labs, Infosys Limited. He has more than 11 years of research experience and 9 years at Infosys Labs. He holds doctoral degree from Indian Institute of Technology, Bombay.