This book was developed by Mike Peralta (Ph.D.), Semiconductor Device Modeling Engineer. His main research interest has been in the statistics of semiconductor devices. Before his position as Device Modeling Engineer (1997-2006 at Burr-Brown/Texas Instruments) he was with the Quality Department at Burr-Brown from 1982 to 1997 where he was involved with test development, statistical training, design of experiments training, test statistics development and training, and mathematical and database software development. (Burr-Brown merged with Texas Instruments in 2000.) From 2006 to 2012 he has be...