X-Ray Diffraction Imaging: Technology and Applications

ISBN-13: 9781498783613 / Angielski / Twarda / 2018 / 256 str.

Joel Greenberg; Krzysztof Iniewski

Opis

Coherent scattering mechanism forms a basis of the x-ray diffraction imaging that is a subject of this book. The x-ray diffraction technology and its various applications in medical, industrial and security fields are also covered.

Spis treści

1 Coded Aperture X-Ray Diffraction Tomography. 2 Semiconductor Sensors for XRD Imaging. 3 Integrated Circuits for XRD Imaging. 4 Applications of X-Ray Diffraction Imaging in Medicine. 5 Materials Science of X-Ray Diffraction 6 X-Ray Diffraction and Focal Construct Technology. 7 X-Ray Diffraction Tomography: Methods and Systems. 8 Energy-Resolving Detectors for XDi Airport Security Systems.

O autorze

Joel A. Greenberg received his B.S.E. in Mechanical and Aerospace Engineering from Princeton University in 2005, and his Ph.D. in physics from Duke University in 2012. He then joined the Duke Imaging and Spectroscopy Program in 2012 as a research scientist and technical/project manager of the computational adaptive X-ray imaging (CAXI) program. Since 2014, Joel has been an Assistant Research Professor of Electrical and Computer Engineering at Duke University and a member of the Fitzpatrick Institute for Photonics. He has published over 30 papers in the areas of nonlinear optics, cold atom physics, compressed sensing and X-ray imaging. His current research focuses on computational sensing and its application to security, medical, and industrial imaging and detection.