ISBN-13: 9783642166341 / Angielski / Twarda / 2011 / 324 str.
ISBN-13: 9783642166341 / Angielski / Twarda / 2011 / 324 str.
X-Ray Diffraction Crystallography presents the fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples. Readers will find a number of exercises calculate specific values for typical examples.