Vlsi-Soc: New Technology Enabler: 27th Ifip Wg 10.5/IEEE International Conference on Very Large Scale Integration, Vlsi-Soc 2019, Cusco, Peru, October

ISBN-13: 9783030532727 / Angielski / Twarda / 2020 / 345 str.

Carolina Metzler; Pierre-Emmanuel Gaillardon; Giovanni De Micheli

Spis treści

Software-Based Self-Test for Delay Faults.- On Test Generation for Microprocessors for Extended Class of Functional Faults.- Robust FinFET Schmitt Trigger Designs for Low Power Applications.- An Improved Technique for Logic Gate Susceptibility Evaluation of Single Event Transient Faults.- Process Variability Impact on the SET Response of FinFET Multi-level Design.- Efficient Soft Error Vulnerability Analysis Using Non-Intrusive Fault Injection Techniques.- A Statistical Wafer Scale Error and Redundancy Analysis Simulator.- Hardware-enabled Secure Firmware Updates in Embedded Systems.- Reliability Enhanced Digital Low-Dropout Regulator with Improved Transient Performance.- Security Aspects of Real-time MPSoCs: The Flaws and Opportunities of Preemptive NoCs.- Offset-Compensation Systems for Multi-Gbit/s Optical Receivers.- Accelerating Inference on Binary Neural Networks with Digital RRAM Processing.- Semi- and Fully-Random Access LUTs for Smooth Functions.- A Predictive Process Design Kit for Three-Independent-Gate Field-Effect Transistors.- Exploiting Heterogeneous Mobile Architectures through a Unified Runtime Framework.