Uncertainty Analysis For NIST Noise-Parameter Measurement

ISBN-13: 9781494743970 / Angielski / Miękka / 2014 / 36 str.

U. S. Department of Commerce

Opis

Some time ago, what is now the Electromagnetics Division of the National Institute of Standards and Technology (NIST) developed the capability to measure noise parameters of amplifiers 1,2]. Recently, modified methods and analysis have been developed and have been applied both to amplifiers 3] and to transistors 4], the latter in an on-wafer environment. For such measurements to be meaningful, the results must be accompanied by corresponding uncertainties.