Thin-Film Transistors

ISBN-13: 9780824709594 / Angielski / Twarda / 2003 / 544 str.

Cherie Kagan; Paul Andry; Kagan R. Kagan

Opis

This is a single-source treatment of developments in TFT production from international specialists. It interweaves overlapping areas in multiple disciplines pertinent to transistor fabrication and explores the killer application of amorphous silicon transistors in active matrix liquid crystal displays. It evaluates the preparation of polycrystalline silicon TFTs for applications in cameras, video recorders, PDAs, and cell phones. The authors provide an introduction to the technology, a historical overview of its development, and a discussion of the characteristics and applications of TFT display technology. This treatment will be useful to students, designers, and engineers who require both the background information and knowledge of the applications of this technology.

O autorze

Cherie R. Kagan is a Research Staff Member at the IBM T. J. Watson Research Center, Yorktown Heights, New York. The author or coauthor of more than 15 professional publications and holder of four patents with four pending, she is a member of the Materials Research Society, the American Chemical Society, and the American Physical Society. Dr. Kagan received the B.S.E. degree (1991) in materials science and engineering and the B.A. degree (1991) in mathematics from the University of Pennsylvania, Philadelphia, and the Ph.D. degree (1996) in electronic materials from the Massachusetts Institute of Technology, Cambridge. Paul Andry is Research Staff Member at the IBM T. J. Watson Research Center, Yorktown Heights, New York. The author or coauthor of more than 20 professional publications and the holder of two patents with eight pending, he is a member of the Materials Research Society and the Society for Information Display. Dr. Andry received the B.Sc. degree (1986) in physics from the University of Waterloo, Ontario, Canada, the M.Sc. degree (1990) in physics from the Universite de Sherbrooke, Quebec, Canada, and the Ph.D. degree (1997) in materials science from the University of Vermont, Burlington.