Testing Integrated Circuits

ISBN-13: 9783639715873 / Angielski / Miękka / 2014 / 160 str.

Itskovich Mikhail

Opis

This book teaches how to design and manufacture a testing system for the next generation of integrated circuits. ... The growing efficiency in manufacturing of semiconductor devices combined with increased speed, size and performance of integrated products puts an incredible pressure on testing and verification technology. While negligible in the past, the cost of verification for a modern semiconductor design can be as high as half of the total manufacturing cost. In order to accommodate testing requirements, modern test equipment must operate up to 100 times faster than the state-of-the-art production circuits while using technologies several generations older. ... This book teaches how to test future generations of integrated circuits by using transient currents measured at the power nodes.

O autorze

Mikhail Itskovich has created and taught Analog and Mixed Signal VLSI courses based on years of experience in design and manufacture of integrated circuits. He received his Ph.D. from University of Maryland in Baltimore County, MD, a J.D. from The George Washington University in Washington, DC, and has multiple other degrees to his credit.