Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices

ISBN-13: 9789812778819 / Angielski / Twarda / 2008 / 368 str.

Takashi Nakamura;Mamoru Baba;Eishi Ibe

Opis

Terrestrial neutron-induced soft errors of semiconductor memory devices are a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices. This book covers the relevant topics in terrestrial neutron-induced soft errors.