ISBN-13: 9789814280839 / Angielski / Twarda / 2009 / 236 str.
ISBN-13: 9789814280839 / Angielski / Twarda / 2009 / 236 str.
Intends to present the capabilities of the synchrotron radiation and scanning probe microscopy techniques, together with general theory work, in elucidating the fundamental electronic and structural properties of semiconductor and metal surfaces, interfaces, nanostructures, layers and diverse biological systems.