Swift Ion Beam Analysis in Nanosciences

ISBN-13: 9781848215771 / Angielski / Twarda / 2017 / 280 str.

Denis Jalabert; Ian Vickridge

Opis

This book examines the different ion beam analysis techniques, which find relevant applications in the field of nanoscience. Ion beam analysis techniques are well established and have been widely used in materials sciences since the 1960s. Over the past two decades, the emergence of nanomaterials in science and technology has pushed many analytical techniques to their limits. This is also the case for techniques using an ion beam to probe nanoscale objects. The book discusses the various possibilities of the ion beam analysis for nanosciences and also seeks to position these techniques over other analytical tools.

Spis treści

Introduction

Fundamentals of ion–solid interactions with a focus on the nanoscale

Channelling and blocking

1D layers: Limits to depth resolution

2D and 3D objects: Aspects of lateral resolution

Porous materials / nanomaterials

Instruments

Grazing incidence RBS

RBS–channelling/blocking

High resolution RBS (magnetic or electrostatic filters)

MEIS

Resonant NRA

The place of nanoIBA in the characterisation forest

Applications

Example of resonances, light element profiling

3D example / quantum dots and nanowires / top down devices

Channelling / defect profiling

Blocking / strain profiling

3D MEIS / Real space structural analysis

Conclusion