Surface Analysis of Polymers by XPS and Static Sims

ISBN-13: 9780521017534 / Angielski / Miękka / 2005 / 216 str.

D. Briggs; D. R. Clarke; S. Suresh

Opis

This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. The author describes the techniques and applications of XPS and SSIMS. He also includes details of case studies, emphasizing the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis.