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Kategorie szczegółowe BISAC

Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

ISBN-13: 9781489987877 / Angielski / Miękka / 2014 / 306 str.

Ruijing Shen; Sheldon X. Tan; Hao Yu
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs Ruijing Shen Sheldon X. Tan Hao Yu 9781489987877 Springer - książkaWidoczna okładka, to zdjęcie poglądowe, a rzeczywista szata graficzna może różnić się od prezentowanej.

Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

ISBN-13: 9781489987877 / Angielski / Miękka / 2014 / 306 str.

Ruijing Shen; Sheldon X. Tan; Hao Yu
cena 451,44
(netto: 429,94 VAT:  5%)

Najniższa cena z 30 dni: 432,37
Termin realizacji zamówienia:
ok. 22 dni roboczych
Dostawa w 2026 r.

Darmowa dostawa!

Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design of VLSI chips.This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits.

  • Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits;
  • Helps chip designers understand the potential and limitations of their design tools, improving their design productivity;
  • Presents analysis of each algorithm with practical applications in the context of real circuit design;
  • Includes numerical examples for the quantitative analysis and evaluation of algorithms presented.
  • Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits;
  • Helps chip designers understand the potential and limitations of their design tools, improving their design productivity;
  • Presents analysis of each algorithm with practical applications in the context of real circuit design;
  • Includes numerical examples for the quantitative analysis and evaluation of algorithms presented.

Kategorie:
Informatyka
Kategorie BISAC:
Technology & Engineering > Electronics - Circuits - General
Computers > Design, Graphics & Media - CAD-CAM
Technology & Engineering > Nanotechnology & MEMS
Wydawca:
Springer
Język:
Angielski
ISBN-13:
9781489987877
Rok wydania:
2014
Wydanie:
2012
Ilość stron:
306
Waga:
0.52 kg
Wymiary:
23.5 x 15.5
Oprawa:
Miękka
Wolumenów:
01

Fundamentals of Statistical Analysis.- Statistical Full-Chip Leakage Power Analysis.- Statistical Full-Chip Dynamic Power Analysis.- Statistical Parasitic Extraction.- Statistical Compact Modeling and Reduction of Interconnects.- Statistical Analysis of Global Interconnects.- Statistical Analysis and Modeling for Analog and Mixed-Signal Circuits.

Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have  become imperative for the successful design of VLSI chips.

This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits. 

  • Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits;
  • Helps chip designers understand the potential and limitations of their design tools, improving their design productivity;
  • Presents analysis of each algorithm with practical applications in the context of real circuit design;
  • Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. 

  • Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits;
  • Helps chip designers understand the potential and limitations of their design tools, improving their design productivity;
  • Presents analysis of each algorithm with practical applications in the context of real circuit design;
  • Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. 



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