Spectrophotometry : Accurate Measurement of Optical Properties of Materials

ISBN-13: 9780123860224 / Angielski / Twarda / 2014 / 560 str.

Thomas Germer

Opis

This volume is an essential handbook for anyone interested in performing the most accurate spectrophotometric or other optical property of materials measurements. The chapter authors were chosen from the leading experts in their respective fields and provide their wisdom and experience in measurements of reflectance, transmittance, absorptance, emittance, diffuse scattering, color, and fluorescence. The book provides the reader with the theoretical underpinning to the methods, the practical issues encountered in real measurements, and numerous examples of important applications.

• Written by the leading international experts from industry, government, and academia
• Written as a handbook, with in depth discussion of the topics
• Focus on making the most accurate and reproducible measurements
• Many practical applications and examples

Spis treści

1. IntroductionGermer, Zwinkels and Tsai2. Theoretical concepts in spectrophotometric measurementsGermer, Zwinkels and Tsai3. Dispersive methodsGaertner, Yoon and Germer4. Fourier transform methodsKaplan and Quijada5. Regular reflectance and transmittancevan Nijnatten6. Diffuse reflectance and transmittanceHöpe7. Spectral fluorescenceZwinkels, DeRose and Lelan8. Angle-resolved diffuse reflectance and scatteringGermer, Stover and Schröder9. Spectral emissivity measurementsWatanabe, Ishii, Wakabayashi, Kumano, and Hanssen10. Color and appearanceNadal, Wyble and Zarobila11. The use of spectrophotometry in the pharmaceutical industryHammond12. Spectrophotometry applications: Remote sensingBruegge, Davies, Schwandner, and Seidel13. MicrospectrophotometryMartin and Eyring

O autorze

Thomas A. Germer received a B.A. in physics from the University of California, Berkeley in 1985. In 1992, he received a Ph.D. in physics from Cornell University in the field of surface electron spectroscopies and surface photochemistry. An interest in optics at surfaces led him to the National Institute of Standards and Technology (NIST), where he held a postdoctoral associateship from 1992 to 1995, performing research in picosecond and femtosecond time-resolved measurements of surface chemical and physical dynamics. He joined the NIST staff as a physicist in the 1995. Since then, he has led the NIST program on light scattering and diffraction from surfaces. His work has earned him the Department of Commerce Bronze and Silver awards, The NIST Chapter of Sigma Xi Young Scientist Award, and Fellow of the SPIE, and he has served as a topical editor for Applied Optics. He has published over 100 articles and has been granted two patents. He developed the SCATMECH library of scattering codes.

Joanne Zwinkels was a Principal Research Officer at the National Research Council of Canada (NRC), retired since February 2020. She is actively involved in international standardization activities and served more than a decade as the NRC representative to the Consultative Committee of Photometry and Radiometry (CCPR), Chair of the Strategic Planning Working Group of CCPR, and International Convenor of ISO TC6/WG3.

From 1993 until 2023 Benjamin Tsai worked as a physical scientist at NIST (National Institute of Standards and Technology) with research projects including the spectral irradiance scale, rapid thermal processing of semiconductor devices, heat flux, skin reflectance, UV exposure of reflectance standards, and photometry (measurement assurance program and research for luminous flux of LEDs).