ISBN-13: 9780367573553 / Angielski / Miękka / 2020 / 138 str.
ISBN-13: 9780367573553 / Angielski / Miękka / 2020 / 138 str.
This book focusses on the spacer engineering aspects of novel MOS-based device–circuit co-design in sub-20nm technology node, its process complexity, variability, and reliability issues. It comprehensively explores the FinFET/tri-gate architectures with their circuit/SRAM suitability and tolerance to random statistical variations.