Software Defect and Operational Profile Modeling

ISBN-13: 9780792382591 / Angielski / Twarda / 1998 / 268 str.

Kai-Yuan Cai; Cai Kai-Yuan Cai;Kai-Yuan Cai

Opis

also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1

Recenzje

`This well-crafted summary of research and engineering in software defect estimation and operational profile modeling is a useful addition to the software reliability engineering literature.'
Computing Reviews (June 1999)

Spis treści

Preface. 1. Introduction. 2. Empirical Regression Methods. 3. Dynamic Methods. 4. Capture-Recapture Methods. 5. Decomposition Methods. 6. Neural Network Methods. 7. Software Defect Estimations Under Imperfect Debugging. 8. Software Operational Profile Modelling. 9. Modeling of Probably Zero-Defect Software. Index.