Scanning Probe Microscopy: A Multidisciplinary Research Tool

ISBN-13: 9789811264740 / Angielski / Twarda / 2027

Jayne C. Garno; Song Xu; Jing-Jiang Yu

Opis

One may think that scanning probe microscopy (SPM) instruments are mainly used to 'look' at a surface, as with an optical microscope. However, SPM encompasses dozens of measurement and lithography modes for fundamental studies and applications spanning a broad range of scientific disciplines, such as chemistry, physics, engineering, material science, nanoscience / nanomedicine, and biology. New SPM technologies enable mapping of surface properties and surface manipulation with atomic precision, which makes it now a standard and indispensable tool in labs across these disciplines.This book provides a comprehensive and high-level guide to the operating principles of a wide array of SPM instruments. While the well-known atomic force microscopy (AFM) is covered in-depth in 9 chapters, modern variants are also introduced, such as chemical force microscopy, magnetic force microscopy, scanning electrochemical microscopy, and near-field scanning optical microscopy, amongst many others, concluding with the futuristic artificial intelligence-driven SPM. The authors — one an accomplished Professor of Chemistry and the others senior research scientists with major SPM companies — explain how the science translates into cutting-edge technology and industrial applications.