Scan Statistics: Methods and Applications

ISBN-13: 9780817647483 / Angielski / Twarda / 2009 / 424 str.

Joseph Glaz; Vladimir Pozdnyakov; Sylvan Wallenstein

Opis

Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology. Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics. Key features:
* Chapters are written by leading experts in the field. * Features many current results and highlights new directions for future research. * Includes challenging theoretical methodological research problems. * Presentation is accessible to statisticians as well as to scientists from other disciplines where scan statistics are employed. * Real-world applications to areas such as bioinformatics and biosurveillance are emphasized. * Contains extensive references to research articles, books, and relevant computer software. Scan Statistics is an excellent reference for graduate students and researchers in applied probability and statistics, as well as for scientists in biology, computer science, pharmaceutical science, medicine, geography, quality control, communications, and epidemiology. The work may also be used as a textbook for a graduate-level seminar on scan statistics.

Recenzje

From the reviews:

"The area of scan statistics has developed rapidly in recent years. ... provided excellent overviews of the area. ... There are many papers of interest here for the readers of Technometrics. ... This reviewer enjoyed thumbing through the pages of this volume and feels that the editors hope that it will serve as a valuable reference and source for researchers in applied probability and statistics and in many other areas of science and technology is well justified." (H. N. Nagaraja, Technometrics, Vol. 53 (1), February, 2011)

Spis treści

Preface Contributors List of Tables List of Figures Joseph Naus: Father of the Scan Statistic \ S. Wallenstein Precedence-Type Test for the Comparison of Treatments with a Control \ N. Balakrishnan and H. K. T. Ng Extreme Value Results for Scan Statistics \ M. V. Boutsikas, M. V. Koutras, and F. S. Milienos Boundary Crossing Probability Computations in the Analysis of Scan Statistics \ H. P. Chan, I-P. Tu, and N. R. Zhang Approximations for Two-Dimensional Variable Window Scan Statistics \ J. Chen and J. Glaz Applications of Spatial Scan Statistics: A Review \ M. A. Costa and M. Kulldorff Extensions of the Scan Statistics for the Detection and Inference of Spatial Clusters \ L. Duczmal, A. R. Duarte, and R. Tavares 1-Dependent Stationary Sequences and Applications to Scan Statistics \ G. Haiman and C. Preda Scan Statistics in Genome-Wide Scan for Complex Trait Loci \ J. Hoh and J. Ott On Probabilities for Complex Switching Rules in Sampling Inspection \ W. Y. W. Lou and J. C. Fu Bayesian Network Scan Statistics for Multivariate Pattern Detection \ D. B. Neill, G. F. Cooper, K. Das, X. Jiang, and J. Schneider ULS Scan Statistic for Hotspot Detection with Continuous Gamma Response \ G. P. Patil, S. W. Joshi, W. L. Myers, and R. E. Koli False Discovery Control for Scan Clustering \ M. Perone-Pacifico and I. Verdinelli Martingale Methods for Patterns and Scan Statistics \ V. Pozdnyakov and J. M. Steele How Can Pattern Statistics Be Useful for DNA Motif Discovery? \ S. Schbath and S. Robin Occurrence of Patterns and Motifs in Random Strings \ V. T. Stefanov Detection of Disease Clustering \ T. Tango Index

O autorze

Joseph Glaz has been appointed (effective July 1, 2011) as head of the Department of Statistics, University of Connecticut. He has co-authored several books. Glaz is the current editor-in-chief of the following Springer journal: Methodology and Computing in Applied Probability.
Honors and Awards include : election to the Connecticut Academy of Arts and Sciences (2011), elected fellow of the Institute of Mathematical Sciences (2009), AAUP Excellence in Research Award (2006), Abraham Wald Prize in Sequential Analysis (2006), elected fellow of the American Statistical Assoc. (2000), elected member of the International Statistical Institute (1999).
Most importantly, Joe Glaz has worked closely with Joseph Naus, the father of scan statistics, since this area of statistics was conceived around 1999.