Reliability and Degradation of III-V Optical Devices

ISBN-13: 9780890066522 / Angielski / Twarda / 1996 / 372 str.

Osamu Ueda

Opis

Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism of degradation, detailing the major degradation modes of optical devices fabricated from three different systems, and describing methods for elimination of defect-generating mechanisms.