ISBN-13: 9789811652837 / Angielski / Miękka / 2022 / 515 str.
ISBN-13: 9789811652837 / Angielski / Miękka / 2022 / 515 str.
This book presents the select proceedings of the International Conference on Evolution in Manufacturing (ICEM 2020), and examines a range of areas including evolution in manufacturing, intelligent networks, bio-Inspired models and algorithms, internet-of-things, and cyber manufacturing. This book intends to provide a contribution to the domain of collaborative and intelligent networks and systems to fill the gap in theories and practical applications through suitable methods and solutions applicable to a wide range of instances. Various topics covered include broad range of research challenges in the fields of artificial intelligence and addressing current and future trends in industry 4.0 oriented scenario, data analytics and big data, operation and manufacturing management. The book will be a valuable reference for beginners, researchers and professionals interested in artificial intelligence in engineering and production management and allied fields.
This book presents the select proceedings of the International Conference on Evolution in Manufacturing (ICEM 2020), and examines a range of areas including evolution in manufacturing, intelligent networks, bio-Inspired models and algorithms, internet-of-things, and cyber manufacturing. This book intends to provide a contribution to the domain of collaborative and intelligent networks and systems to fill the gap in theories and practical applications through suitable methods and solutions applicable to a wide range of instances. Various topics covered include broad range of research challenges in the fields of artificial intelligence and addressing current and future trends in industry 4.0 oriented scenario, data analytics and big data, operation and manufacturing management. The book will be a valuable reference for beginners, researchers and professionals interested in artificial intelligence in engineering and production management and allied fields.