Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices

ISBN-13: 9789812389404 / Angielski / Twarda / 2004 / 348 str.

Ronald D. Schrimpf; Daniel M. Fleetwood

Opis

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.