Quantum Metrology with Photoelectrons: Volume I: Foundations

ISBN-13: 9781681746852 / Angielski / Miękka / 2018 / 165 str.

Paul Hockett

Opis

The increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. This volume discusses the fundamental concepts along with recent and emerging applications.

Spis treści

• Preface
• Acknowledgments
• Part I Concepts and fundamentals
• 1. Introduction: concepts in photoionization interferometry
• 2. Fundamentals of photoelectron interferograms
• 3. Multi-photon processes
• Part II Examples and numerics
• 4. Scattering wavefunctions and photoionization: Coulombic systems
• 5. Scattering wavefunctions and photoionization: non-Coulombic systems
• 6. Wavepacket dynamics
• 7. Light and matter