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Physical Design for 3D Integrated Circuits

ISBN-13: 9780367778873 / Angielski / Miękka / 2021 / 416 str.

Physical Design for 3D Integrated Circuits  9780367778873 Taylor and Francis - książkaWidoczna okładka, to zdjęcie poglądowe, a rzeczywista szata graficzna może różnić się od prezentowanej.

Physical Design for 3D Integrated Circuits

ISBN-13: 9780367778873 / Angielski / Miękka / 2021 / 416 str.

cena 342,79
(netto: 326,47 VAT:  5%)

Najniższa cena z 30 dni: 302,19
Termin realizacji zamówienia:
ok. 22 dni roboczych.

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Physical Design for 3D Integrated Circuits reveals how to effectively and optimally design 3D integrated circuits (ICs). It also analyzes the design tools for 3D circuits while exploiting the benefits of 3D technology.The book begins by offering an overview of physical design challenges with respect to conventional 2D circuits, and then each chapter delivers an in-depth look at a specific physical design topic. This comprehensive reference:Contains extensive coverage of the physical design of 2.5D/3D ICs and monolithic 3D ICsSupplies state-of-the-art solutions for challenges unique to 3D circuit designFeatures contributions from renowned experts in their respective fieldsPhysical Design for 3D Integrated Circuits provides a single, convenient source of cutting-edge information for those pursuing 2.5D/3D technology.

Kategorie:
Technologie
Kategorie BISAC:
Technology & Engineering > Electronics - Microelectronics
Computers > Logic Design
Technology & Engineering > Electrical
Wydawca:
Taylor and Francis
Język:
Angielski
ISBN-13:
9780367778873
Rok wydania:
2021
Ilość stron:
416
Waga:
0.73 kg
Wymiary:
24.61 x 18.9 x 2.16
Oprawa:
Miękka
Wolumenów:
01

2.5D/3D ICs: Drivers, Technology, Applications, and Outlook. Overview of Physical Design Issues for 3D-Integrated Circuits. Detailed Electrical and Reliability Study of Tapered TSVs. 3D Interconnect Extraction. 3D Placement and Routing. Power and Signal Integrity Challenges in 3D Systems-on-Chip. Design Methodology for TSV-Based 3D Clock Networks. Design Methodology for 3D Power Delivery Networks. Live Free or Die Hard: Design for Reliability in 3D Integrated Circuits. Thermal Modeling and Management for 3D Stacked Systems. Exploration of the Thermal Design Space in 3D Integrated Circuits. Dynamic Thermal Optimization for 3D Many-Core Systems. TSV-to-Device Noise Analysis and Mitigation Techniques. Overview of 3D CAD Design Tools. Design Challenges and Solutions for Monolithic 3D ICs. Design of High-Speed Interconnects for 3D/2.5D ICs without TSVs. Challenges and Future Directions of 3D Physical Design.

Aida Todri-Sanial holds a BS in electrical engineering from Bradley University, IL; an MS in electrical engineering from California State University, Long Beach, CA; and a PhD in electrical and computer engineering from the University of California, Santa Barbara. She has held visiting research positions at Cadence Design Systems, Mentor Graphics, IBM TJ Watson Research Center, and STMicroelectronics. She was a recipient of the John Bardeen Fellowship and an R&D engineer at Fermilab, IL. She is currently a research scientist at CNRS, France and a member of the Microelectronics Department at LIRMM, where she is the group leader of Integration and Design of Energy-Aware Circuits and Systems. Widely published, highly decorated, and an IEEE and ACM member, Dr. Todri-Sanial participates in several international conference committees and serves as an associate editor for IEEE TVLSI journal. She is also engaged with the EPWS and WiTEC.



Chuan Seng Tan holds a BEng in electrical engineering from the University of Malaya, Malaysia; an MEng in advanced materials from the National University of Singapore; and a PhD in electrical engineering from the Massachusetts Institute of Technology, Cambridge. He has been a research engineer with the Institute of Microelectronics, Singapore; an Applied Materials Graduate Fellow; and an intern at Intel Corporation, Oregon. He is currently an associate professor at Nanyang Technological University, Singapore, where he previously served as a Lee Kuan Yew Postdoctoral Fellow and an inaugural Nanyang Assistant Professor. Widely published, Dr. Tan participates in several international conference committees and is a member of the IEEE. He has edited three and co-authored two books, and serves as an associate editor for Elsevier Microelectronics Journal.



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