Pathological Brain Detection by Advanced Extreme Learning Machines

ISBN-13: 9783659585098 / Angielski / Miękka / 2017 / 68 str.

Siyuan Lu

Opis

Automatic pathological brain detection is significant for brain disease treatment. Computer aided diagnosis systems can generate diagnosis results based on medical images, which is helpful for the doctors and physicians. In this monograph, we discussed several computer aided diagnosis systems for detecting pathological brain in magnetic resonance images based on computer vision and advanced extreme learning machines. These methods can yield good detection accuracy according to experiments. This monograph is suitable for doctors, physicians, and scholars majoring in computer vision and machine learning.

O autorze

Siyuan Lu received B.S. in Nanjing Normal University of Computer Science & Technology 2014. Now he is pursuing the M.S. in Nanjing Normal University of Computer Science & Technology, majoring in image processing and machine learning.