Optical Metrology

ISBN-13: 9780470843000 / Angielski / Twarda / 2002 / 392 str.

Kjell Gasvik

Opis

New material on computerized optical processes, computerized ray tracing, and the fast Fourier transform, Bibre-Bragg sensors, and temporal phase unwrapping.
* New introductory sections to all chapters.
* Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry.
* Thorough coverage of the CCD camera.

Spis treści

Preface to the Third Edition

Basics

Gaussian Optics

Interference

Diffraction

Light Sources and Detectors

Holography

Moire Methods, Triangulation

Speckle Methods

Photoelasticity and Polarized Light

Digital Image Processing

Fringe Analysis

Computerized Optical Processes

Fibre Optics Metrology

Appendix: Complex Numbers

Appendix: Fourier Optics

Appendix Fourier Series

Appendix The Least Squares Error Method

Appendix Semiconductor Devices

Blurb

Recent advances in optical devices and computer technology have enabled the development of new optical systems and techniques for measurement. Providing practical guidance for readers with a minimal background in optics, the third edition of this classic book explores the latest optical metrology technologies, from digital holography and digital speckle photography to fibre Bragg sensors and optical coherence tomography.

Features include:
∗ A chapter on computerised optical processes such as electronic speckle interferometry, digital holography and digital speckle photography.

∗ Sections introducing optical sources and detectors, including diode lasers, light emitting diodes and photoelectric detectors and the CCD camera.

∗ Coverage of digital fringe pattern measurement techniques with special emphasis on phase measurement interferometry and phase unwrapping.

∗ Detailed discussion on lasers and laser principles, including an introduction to radiometry and photometry.

∗ A revised chapter on digital image processing, including noise suppression, edge– and fringe detection with sub–pixel accuracy, the DFT and the FFT.

∗ End–of–chapter problems and solutions.
This holistic treatment provides students and professionals in the field of optical and communications engineering with an accessible and self–contained guide to all of the main optical metrology techniques in use today.