ISBN-13: 9783659400599 / Angielski / Miękka / 2013 / 72 str.
The current book is a review of author research about nonlinear dynamics in optically injected semiconductor laser. a) A new method is introduced to measure the thickness and refractive index of transparent thin films by Self-mixing interferometry which is an important application of weak optical feedback in semiconductor lasers. b) The regimes of perturbation in a laser diode subjected to delayed optical feedback (DOF) from an external reflector is numerically analyzed from short to long cavity and from weak to strong optical feedback.
The current book is a review of author research about nonlinear dynamics in optically injected semiconductor laser. a) A new method is introduced to measure the thickness and refractive index of transparent thin films by Self-mixing interferometry which is an important application of weak optical feedback in semiconductor lasers. b) The regimes of perturbation in a laser diode subjected to delayed optical feedback (DOF) from an external reflector is numerically analyzed from short to long cavity and from weak to strong optical feedback.