Nonlinear Super-Resolution Nano-Optics and Applications

ISBN-13: 9783662444870 / Angielski / Twarda / 2014 / 256 str.

Jingsong Wei

Opis

This book covers many advances in the subjects of nano-optics and nano photonics. The author describes the principle and technical schematics of common methods for breaking through the optical diffraction limit and focuses on realizing optical super-resolution with nonlinear effects of thin film materials. The applications of nonlinear optical super-resolution effects in nano-data storage, nanolithography, and nano-imaging are also presented. This book is useful to graduate students majoring in optics and nano science and also serves as a reference book for academic researchers, engineers, technical professionals in the fields of super-resolution optics and laser techniques, nano-optics and nano photonics, nano-data storage, nano imaging, micro/nanofabrication and nanolithography and nonlinear optics.

Spis treści

General methods for obtaining nanoscale light spot.- Third-order nonlinear effects.- Characterization methods for nonlinear absorption and refraction coefficients.- Optical nonlinear absorption and refraction of semiconductor thin films.- Nanoscale spot formation through nonlinear refraction effect.- Optical super-resolution effect through nonlinear saturation absorption.- Resolving improvement by combination of pupil filters and nonlinear thin films.- Applications of nonlinear super-resolution thin films in nano-optical data storage.- Applications of nonlinear super-resolution effect in nanolithography and high resolving light imaging.- Remarkings.

O autorze

Jingsong Wei received his PhD from Chinese Academy of Sciences. He has about 20 years’ research experience in nonlinear nano-optics and nano photonics, phase change thin films, high-density data storage, nanolithography and high-resolving optical imaging. He has published more than 100 papers in peer-reviewed journals and international conference proceedings. He is a full-time professor of Shanghai Institute of Optics and Fine Mechanics (SIOM) of Chinese Academy of Sciences (CAS) and a professor at University of Chinese Academy of Sciences.