Noncontact Atomic Force Microscopy: Volume 2

ISBN-13: 9783642260704 / Angielski / Miękka / 2012 / 401 str.

Seizo Morita;Franz J. Giessibl;Roland Wiesendanger

Opis

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

Spis treści

Method for Precise Force Measurements.- Force Spectroscopy on Semiconductor Surfaces.- Tip#x2013;Sample Interactions as a Function of Distance on Insulating Surfaces.- Force Field Spectroscopy in Three Dimensions.- Principles and Applications of the qPlus Sensor.- Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond.- Atom Manipulation on Semiconductor Surfaces.- Atomic Manipulation on Metal Surfaces.- Atomic Manipulation on an Insulator Surface.- Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM.- Multi-Scale Modelling of NC-AFM Imaging and Manipulation at Insulating Surfaces.- Magnetic Exchange Force Microscopy.- First-Principles Simulation of Magnetic Exchange Force Microscopy on Fe/W(001).- Frequency Modulation Atomic Force Microscopy in Liquids.- Biological Applications of FM-AFM in Liquid Environment.- High-Frequency Low Amplitude Atomic Force Microscopy.- Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy.