Microelectronic Reliability: v. 2: Integrity, Assessment and Assurance

ISBN-13: 9780890063507 / Angielski / Twarda / 1989 / 556 str.

Emiliano Pollino

Opis

A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi