Mems and Nanotechnology, Volume 5: Proceedings of the 2013 Annual Conference on Experimental and Applied Mechanics

ISBN-13: 9783319345628 / Angielski / Miękka / 2016 / 134 str.

Gordon Shaw III; Barton C. Prorok; Lavern Starman

Opis

MEMS and Nanotechnology, Volume 5: Proceedings of the 2013 Annual Conference on Experimental and Applied Mechanics, the fifth volume of eight from the Conference, brings together contributions to this important area of research and engineering.

Spis treści

Warpage Measurement of Simulated Electronic Packaging Assembly.- Nanomechanical Characterization of Lead Free Solder Joints.- In-Situ Surface Mount Process Characterization Using Digital Image Correlation.- Acoustic Waveform Energy as an Interconnect Damage Indicator.- Shape Optimization of Cantilevered Piezoelectric Devices.- Unique Fabrication Method for Novel MEMS Micro-contact Structure.- A Frequency Selective Surface Design Fabricated With Tunable RF Meta-atoms.- Stress Characterization in Si/SiO2 Spherical Shells Used in Micro-Robotics.- MEMS Cantilever Sensor Design for Photoacoustic Detection of Terahertz Radiation.- In-Plane MEMS Acoustic Emission Sensors Development and Experimental Characterization.- New Insight into Pile-Up in Thin Film Indentation.- Mapping the Mechanical Properties of Alloyed Magnesium (AZ 61).- Temperature Dependent Micromechanical Testing on the Formation of Cu/Sn Intermetallic Thin Films.- Molecular Interactions on InxGa1-xN.- Timoshenko Beam Model for Lateral Vibration of Liquid-Phase  Microcantilever-Based Sensors.- Improvement in Uncertainty of Tuning Fork-based Force Sensor Stiffness Calibration via the Indentation Method Using Direct Determination of Contact and Machine Compliance.- Flexible Terahertz Metamaterials for Frequency Selective Surfaces.

Blurb

MEMS and Nanotechnology, Volume 5: Proceedings of the 2013 Annual Conference on Experimental and Applied Mechanics, the fifth volume of eight from the Conference, brings together contributions to this important area of research and engineering.  The collection presents early findings and case studies on a wide range of areas, including:

 

Microelectronics Packaging

Single Atom/Molecule Mechanical Testing

MEMS Devices & Fabrication

In-Situ Mechanical Testing

Nanoindentation

Experimental Analysis of Low-Dimensional Materials for Nanotechnology