Measurement and Modeling of Silicon Heterostructure Devices

ISBN-13: 9781420066920 / Angielski / Twarda / 2007 / 1 str.

John D. Cressler

Opis

Drawn from the comprehensive and well-reviewed Silicon Heterostructure Handbook, this volume focuses on measurement and modeling of high-speed conductor devices, a topic that is often absent in the technical literature. The author provides experience-based tricks of the trade and the subtle nuances of measuring and modeling, making this an important reference for semiconductor fabrication laboratory workers. Topics include compact modeling using integrated CAD tools and design kits, noise mitigation approaches, Germanium RF designs, transmission lines, and improved de-embedding techniques.

Spis treści

Contents
Measurement and Modeling
Overview: Measurement and Modeling; J.D. Cressler
Best-Practice AC Measurement Techniques; R.A. Groves
Industrial Application of TCAD for SiGe Development; D.C. Sheridan, J.B. Johnson, and R. Krishnasamy
Compact Modeling of SiGe HBTs: HICUM; M. Schröter
Compact Modeling of SiGe HBTs: MEXTRAM; S. Mijalkovic
CAD Tools and Design Kits; S.E. Strang
Parasitic Modeling and Noise Mitigation Approaches in Silicon Germanium RF Designs; R. Singh
Transmission Lines on Si; Y.V. Tretiakov
Improved De-Embedding Techniques; Q. Liang

O autorze

John D. Cressler