Materials Characterization Techniques

ISBN-13: 9781420042948 / Angielski / Twarda / 2008 / 344 str.

Sam Zhang; Lin Li; Ashok Kumar

Opis

Presents the principles of surface and structural characterization techniques for quality assurance, contamination control, and process improvement. This book reviews popular and powerful analysis and quality control tools, explaining the appropriate uses and related technical requirements.

Spis treści

Preface. Introduction. Contact Angle in Surface Analysis. X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy. Scanning Tunneling Microscopy and Atomic Force Microscopy. X-ray Diffraction. Transmission Electron Microscopy. Scanning Electron Microscopy. Chromatographic Methods. Infrared Spectroscopy and UV/Vis Spectroscopy. Macro and Micro Thermal Analyses. Laser Confocal Fluorescence Microscopy. Index.

O autorze

Sam Zhang, Lin Li, Ashok Kumar