MTConnect To Measure Is To Know

ISBN-13: 9780989074209 / Angielski / Miękka / 2013 / 264 str.

Dave Edstrom; Suzanne Leonard; Suzanne Leonard

Opis

This book answers the question, "how and why a royalty-free and open source standard is revolutionizing the business and technology of manufacturing." This is the world's first book on MTConnect and open systems. This book is not just about MTConnect, but it is first a book that discusses the many lessons learned in the world of open systems. MTConnect will be more important in the 21st century for manufacturing than CNC was for manufacturing in the 20th century. -John Byrd Former President of AMT - The Association For Manufacturing Technology I am very glad to see that MTConnect continues to thrive and has become a true game changer for manufacturing. I enjoyed working with Dave on MTConnect and believe this book, MTConnect: To Measure Is To Know, is a great way to learn not only about MTConnect, but also to understand the important principles and lessons learned from open systems that Dave shares with the reader. -Dave Patterson David A. Patterson joined the faculty of the University of California, Berkeley, in 1977. He is holder of the E.H. and M.E. Pardee Chair of Computer Science and is a member of the National Academy of Engineering and the National Academy of Sciences. Sun Microsystems forever changed the world of computing in many significant ways. Dave's book, MTConnect: To Measure Is To Know, is a great way to not only learn about this game changing technology called MTConnect, but to understand how the open system principles, that we believed so strongly in at Sun Microsystems, can be applied to manufacturing. -Scott McNealy Co-Founder, President and Chairman of the Board for Sun Microsystems