LabVIEW Based Automation Guide for Microwave Measurements

ISBN-13: 9789811062797 / Angielski / Miękka / 2017 / 45 str.

Satya Kesh Dubey; Naina Narang; P. S. Negi

Opis

The book is focused on measurement automation, specifically using the LabView tool. The book includes many examples, illustrations, flowcharts, measurement results and screenshots of a worked-out automation software for microwave measurement.

Spis treści

See attached.

O autorze

Satya Kesh Dubey completed his Ph.D. in Electronics from Allahabad University, Allahabad, India, with eight International Journal Papers. He joined the National Institute of Technology, Raipur (C.G.) as a Lecturer in 2009. During 2009–2010, he served the Institute for Plasma Research, Ahmedabad, India as a Postdoctoral fellow for a year in the Microwave Diagnostic Group. In 2010, he joined National Aerospace Laboratories, Bangalore as Scientist Fellow in the Computational Electromagnetic group. In 2012, he joined National Physical Laboratory, New Delhi as a Scientist in Microwave activity. He has guided more than 15 M.Tech. students and two Ph.D. scholars are enrolled under his guidance. He has published 25 papers in different international journals and conference proceedings with h-index 7 and i-index 3. His current areas of research are biological effect of electromagnetic (EM) radiations, electromagnetic induced transparency, E-field probes and sensors, specific absorption rate (SAR) probes, microstrip antenna, millimeter wave, and computational modeling of biological tissue in EM radiations.

Naina Narang graduated in 2012 from Kurukshetra University, India with Bachelors in Computer Engineering. After graduation, she joined the CSIR-National Physical Laboratory, India as a Research Intern and worked for two years on laboratory automation required for radio frequency (RF) Attenuation and Impedance Standards. In 2014, she enrolled in the Ph.D. program in the Academy of Scientific and Innovative Research (AcSIR) and started working on the establishment of Standards of Specific Absorption Rate (SAR). She has 2 SCI publications and 4 conference papers. She has keen interest in instrument control, LabVIEW programming for automation, computational and numerical techniques for electromagnetic. Presently, she is working on software copyright for simulation of nanoparticle response in RF exposure.

P.S. Negi is presently the Head of Microwave Standards group in Apex level Standards and Industrial Metrology, CSIR-National Physical Laboratory, New Delhi. He has an experience of more than 30 years and expertise in attenuation and impedance measurement. He has piloted/participated in several key/supplementary comparisons at international level sponsored by International Bureau of Weights and Measures (BIPM), France. He has developed primary mismatch standards, 30 MHz WBCO-based primary standard for attenuation with high accuracy and is the author of more than 100 Journal and Conference papers. He is presently supervising three activities that deal with various parameters such as microwave attenuation, impedance and power standards along with the low- and high-frequency voltage and current standards.

V.N. Ojha is presently the Head of Apex Level Standards and Industrial Metrology. He worked as a Scientist at the CSIR-National Physical Laboratory, New Delhi for more than 30 years and now leads the Electrical and Electronics Standards in the organization. He has keen research interest in low temperature microwave measurements, Josephson junction, Quantum Hall effect and Watt balance and is the author of more than 100 Journal and Conference papers. He has been awarded internationally the Deutscher Akademischer Austausch Dienst (DAAD) Fellowship during 1990–1992 and the URSI Young Scientist Award, Belgium in 1993. In 1992, he was also awarded the CSIR-Young Scientist Award in Physical Science.

Blurb

The book is focused on measurement automation, specifically using the LabView tool. It explains basic measurements in a simplified manner with appropriate step-by-step explanations and discussions of instrument capabilities. It touches upon aspects of measurement science, microwave measurements and software development for measurement. The book can be used as a guide by technicians, researchers and scientists involved in metrology laboratories to automate measurements. The book explains the development process for automation of measurement systems for every step of the software development lifecycle. It covers system design and automation policy creation. The book uses a top-down approach which enables the reader to relate their own problems and develop a system with their own analysis. The book includes many examples, illustrations, flowcharts, measurement results and screenshots of a worked-out automation software for microwave measurement. The book includes discussions on microwave measurements-attenuation, microwave power and E-field strength. The contents of this book will be of interest to students, researchers and scientists working in the field of electromagnetism, antennas, communication and electromagnetic interference/electromagnetic compatibility (EMI/EMC).